Mid-infrared InAs/InAsSb Type-II superlattices grown on silicon by MOCVD

نویسندگان

چکیده

• MOCVD growth of InAs/InAsSb Type-II superlattice on Si substrates. IMF was utilized between GaAs and GaSb to overcome the mismatch. Photoluminescent characteristics comparable equivalent MBE grown results. The GaSb/GaAs/Si buffer layer structure demonstrated for T2SL. In this work we report type-II (T2SL) onto substrates via use a all by MOCVD. Transmission electron microscopy (TEM) used show effectiveness in reducing threading dislocation density verify formation an interfacial misfit array layers. Electron channelling contrast imaging measure 6.73 × 10 8 /cm 2 at surface TEM X-ray diffraction that T2SL itself high quality considering large mismatch heteroepitaxy. Fourier transform infrared spectroscopy photoluminescence performance which found have FWHM 50 meV peak wavelength 4.5 µm 77 K. These results are step forward towards integration full device structures

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ژورنال

عنوان ژورنال: Journal of Crystal Growth

سال: 2022

ISSN: ['1873-5002', '0022-0248']

DOI: https://doi.org/10.1016/j.jcrysgro.2022.126860